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Citation 29
Accession Number
005219734
Author
Weigold E. Cai YQ. Canney SA. Kheifets AS. McCarthy IE. Storer P. Vos M.
Institution
Res. Sch. of Phys. Sci. & Eng., Australian Nat. Univ., Canberra, ACT,
Australia.
Title
Direct observation of energy-momentum densities in solids.
Source
CSIRO. Australian Journal of Physics, vol.49, no.2, 1996, pp.543-54.
Australia.
Country of Publication
Australia.
Conference Information
Advances in Atomic and Molecular Collisions and Spectroscopy. Canberra, ACT,
Australia. 13-15 Feb. 1995.
Abstract
Electron momentum spectroscopy (EMS), based on kinematically complete observations of high energy electron impact ionisation events, directly observes energy-momentum dispersion laws and densities of electrons in solids. The valence electronic structure in the near surface region, up to a depth of about 20 AA, is probed for thin free-standing films (about 100 AA) by the multiparameter EMS spectrometer at Flinders University. The principles of the measurement are described and its application to the determination of energy-momentum densities in a range of amorphous, polycrystalline and crystalline materials is discussed. (16 References).
Abstract Number
A9609-7920K-001
Subject Headings
Electron density
Electron impact ionisation
Electron spectra
Surface states
Key Phrase Identifiers
energy-momentum densities; solids; electron momentum spectroscopy;
kinematically complete observations; high energy electron impact ionisation
events; energy-momentum dispersion laws; electron densities; valence
electronic structure; thin free-standing films; amorphous materials;
polycrystalline materials; crystalline materials.
Classification Codes
Other electron-surface impact phenomena [A7920K]; Electronic surface states
[A7320].
Treatment
Theoretical or mathematical. Experimental.
CODEN
AUJPAS
Language
English.
ISSN
0004-9506.
U.S. Copyright Clearance Center Code
0004-9506/96/020543$05.00.
Publication Type
Conference Paper.
SICI
0004-9506(1996)49:2L.543:DOEM;1-2
Update Code
199600.
Copyright
Copyright 1996, IEE.