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Citation 1

Accession Number

005963466

Author

Canney S. Kheifets A. Vos M. Weigold E.

Institution

Phys. Dept., Flinders Univ., Adelaide, SA, Australia.

Title

Quantitative electron momentum spectroscopy of aluminum films.

Source

Elsevier. Journal of Electron Spectroscopy & Related Phenomena, vol.88-91,
March 1998, pp.247-53. Netherlands.

Country of Publication

Netherlands.

Conference Information

Seventh International Conference on Electron Spectroscopy. Chiba, Japan. 8-12
Sept. 1997.

Abstract

We present measurements of the spectral momentum density of aluminum films and compare these results with two different theories. One theory is a standard band structure calculation, taking into account the lattice potential; the other theory neglects the lattice potential, but takes electron-electron correlations approximately into account. Near the Fermi level, the band structure calculations and jellium-type many-body calculations provide satisfactory results, especially if multiple scattering effects are taken into account. The measured intensity at binding energies exceeding the single-particle band width is too large, even after correction for multiple scattering effects for the band structure calculations. The jellium-type manybody calculations have more intensity than the band structure-type calculations at higher binding energies. However the sharp satellite features present in this theory are not observed in the experiment. (17 References).

Abstract Number

A9816-7990-001

Subject Headings

Aluminium
Band structure
Binding energy
Electron spectra
Fermi level
Metallic thin films

Key Phrase Identifiers

quantitative electron momentum spectroscopy; Al films; spectral momentum
density; band structure; lattice potential; electron-electron correlations;
Fermi level; jellium-type many-body calculations; multiple scattering
effects; binding energies; sharp satellite features; Al.

Classification Codes

Other topics in emission and impact phenomena in condensed matter [A7990];
Band structure of crystalline metals [A7125P]; Electronic properties of
metallic thin films [A7360D].

Treatment

Experimental.

Chemicals

Al/el.

CODEN

JESRAW

Language

English.

ISSN

0368-2048.

U.S. Copyright Clearance Center Code

0368-2048/98/$19.00.

Document Number

S0368-2048(97)00135-7.

Publication Type

Conference Paper.

SICI

0368-2048(199803)88/91L.247:QEMS;1-A

Update Code

199827.

Copyright

Copyright 1998, IEE.

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